Jun 26, 2022  
2014 - 2015 Catalog 
    
2014 - 2015 Catalog Archives - Prior Version

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ELT 225 - Characterization, Testing of Nanofabricated Structures and Materials


This course examines a variety of techniques and measurements essential for testing and for controlling material fabrication and final device performance. Characterization includes electrical, optical, physical, and chemical approaches. The characterization experience will include hands-on use of tools such as the Atomic Force Microscope (AFM), Scanning Electron Microscope (SEM), fluorescence microscopes, and fourier transform infrared spectroscopy.
3 credits



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